RFID Analyst

In depth analysis on RFID and Smart Label technologies from this leading independent journal. We invest tens of thousands of dollars to send our technical experts to conferences and organisations you may not visit. We travel intensively from New Zealand to China, the USA, Europe and the Middle East. Read new forecasts, technology assessments and more. This is not another newsletter full of misleading press releases. It is serious analysis with numbers, figures and graphs.

 

This journal gives a balanced view of the subject, and to this end we do not accept paid advertising or sponsorship.

 

Further, we seek to provide original useful material, not available elsewhere. For example, we attend many of the conferences you may miss and we analyse their content. We visit faraway places where interesting work is being done and give you the news first. We interpret future trends. Our technical graduates travel the world intensively on your behalf. We also commission many guest columnists giving insights from their expertise.

For example, in 2006 alone, this journal has amounted to over 350 pages of original insight and analysis, covering, for example, research trips made by IDTechEx to China, Japan, Australia, New Zealand, Europe and North America. We give you our unbiased opinion on the industry, emerging technologies, company developments, and conference reports from around the world. New research is exclusively revealed here first. Please let us know your feedback: contact Glyn Holland, Senior Editor, .

 

Sample the quality for yourself by reading one of our free issues listed on the right.

 

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